发明名称 Selective display of waveforms governed by measured parameters
摘要 Disclosed is a test and measurement instrument that includes a signal input structured to receive a modulated radio frequency (RF) signal under test and a demodulator structured to extract a digital signal from the received modulated RF signal. The extracted digital signal has a measurable parameter. The instrument also includes a display controller structured to display the extracted demodulated signal at one of at least two different intensities based on the measured parameter of the digital signal. In other embodiments the signal need not be an RF signal. Methods of operation are also described.
申请公布号 US9443490(B2) 申请公布日期 2016.09.13
申请号 US201213538978 申请日期 2012.06.29
申请人 TEKTRONIX, INC. 发明人 Ward Benjamin A.;Dobyns Kenneth P.;Waldo Gary J.
分类号 G01R23/00;G09G5/10;G09G5/00 主分类号 G01R23/00
代理机构 代理人 Lenihan Thomas F.;Johnson Marger
主权项 1. A test and measurement instrument, comprising: a signal input structured to receive a modulated radio frequency (RF) signal under test; a demodulator structured to extract a digital signal from the received modulated RF signal, the digital signal having a measurable parameter; and a display controller structured to display the extracted demodulated signal at one of at least two different intensities based on the measured parameter of the digital signal in which the digital signal carried by the modulated RF signal is a burst-mode data signal, in which the display controller is structured to display the extracted demodulated signal at a high intensity when the burst-mode is active, and is structured to display the extracted demodulated signal at a low intensity when the burst-mode is inactive.
地址 Beaverton OR US