发明名称 Memory system and method for selecting memory dies to perform memory access operations in based on memory die temperatures
摘要 A memory system and method are provided for selecting memory dies for memory access operations based on memory die temperatures. The memory system has a plurality of memory dies, where each memory die has its own temperature sensor. In one embodiment, the memory system selects which memory dies to perform memory access operations in based on the temperatures of the memory dies. In another embodiment, a controller of the memory system selects which memory dies to thermal throttle memory access operations in based on the detected temperatures. In yet another embodiment, a temperature-aware media management layer module of the memory 1 system routes a memory access operation from a first memory die to a second memory die based on the temperatures of the memory dies.
申请公布号 US9489146(B2) 申请公布日期 2016.11.08
申请号 US201414565125 申请日期 2014.12.09
申请人 SanDisk Technologies LLC 发明人 Erez Eran
分类号 G11C7/04;G06F3/06 主分类号 G11C7/04
代理机构 Brinks Gilson & Lione 代理人 Brinks Gilson & Lione
主权项 1. A method for selecting memory dies for performing memory access operations in based on memory die temperatures, the method comprising: performing the following in a memory system comprising a plurality of memory dies, each memory die having its own temperature sensor: monitoring temperatures of the memory dies sensed by the temperature sensors;selecting which memory dies to perform memory access operations in based on the temperatures of the memory dies; andperforming memory access operations in the selected memory dies.
地址 Plano TX US