Temperature-compensated measuring probe to be received in a workpiece-processing machine, and temperature compensation of a measuring probe

摘要

The proposed temperature compensation for a measuring probe to be received in a workpiece-processing machine provides a measuring probe, measuring in contacting or non-contacting manner, for registering measured values in respect of a workpiece and for outputting signals that are representative of the measured values, whereby the measuring probe exhibits a probing device for one-dimensional or multi-dimensional probing of a workpiece, at least one probing sensor for converting such probing operations into the representative signals, at least one temperature sensor which has been received in the measuring probe in order to generate a signal that is representative of the temperature of the measuring probe, and a linking device which links the signals of the probing sensor with the signals of the temperature sensor to yield a temperature-compensated probing signal which is intended to be output to a numerical control system of the workpiece-processing machine.

主权项

1. A temperature-compensated measuring probe (MTS, MTE), to be received in a workpiece-processing machine (WBM) and measuring in contacting or non-contacting manner, for registering measured values in respect of a workpiece (WS) and for outputting signals that are representative of the measured values, wherein the measuring probe (MTS, MTE) comprises
a probing device (TE) for one-dimensional or multi-dimensional probing of a workpiece (WS), at least one probing sensor (ASE) for converting such probing operations into signals, at least one temperature sensor (TS) which has been assigned to the measuring probe (MTS) in order to generate a signal (T) that is representative of the temperature of the measuring probe (MTS), and a linking device (VE) which links the signals of at least one probing sensor (ASE) with the signals (T) of the temperature sensor (TS) to yield a temperature-compensated probing signal (TKAS) which is intended to be output to a numerical control system (NC) of the workpiece-processing machine (WBM),wherein the linking device (VE) links the signals of at least one probing sensor (ASE) with the signals (T) of the/each temperature sensor (TS) to yield a temperature-compensated probing signal (TKAS) in such a manner that, depending on the temperature that the signal (T) of the/each temperature sensor (TS) reproduces and, where appropriate, on a rate of feed of the measuring probe in the course of probing, a signal of the at least one probing sensor (ASE) is output in time-delayed manner as temperature-compensated probing signal (TKAS), andwherein the time-delayed manner is determined by a delay-time processed in the linking device (VE).