发明名称 Scanning microscope with orthogonally displaced scanning head
摘要 The microscope has a scanning head which is displaced in orthogonal directions relative to the surface of the scanned microscope sample. A defined gap is maintained between the scanning head and the sample surface. The scanning signals for both orthogonal directions are provided by a scanning signal generator (78) and used to provide corresponding drive currents for displacement of the scanning head. A proportional-integral control (76) is used to maintain the required spacing gap using a further positioning drive acting in a direction perpendicular to the scanning drives in response to a proportional-integral signal representative of the spacing gap. The drive currents are limited by the magnification factor.
申请公布号 DE19816480(A1) 申请公布日期 1998.10.15
申请号 DE1998116480 申请日期 1998.04.14
申请人 SEIKO INSTRUMENTS INC., CHIBA, JP 发明人 MATSUZAKI, RYUICHI, CHIBA, JP
分类号 G01B21/30;G01B7/34;G01H17/00;G01N37/00;G01Q10/04;G01Q10/06;G01Q30/04;G01Q60/24;H01J37/28;(IPC1-7):H01J37/28 主分类号 G01B21/30
代理机构 代理人
主权项
地址