发明名称 ELECTRON MICROSCOPE HAVING CARRIER
摘要 PROBLEM TO BE SOLVED: To provide an electron microscope which allows for reduction in size and cost, by performing buffering and temperature control of a sample effectively.SOLUTION: An electron microscope 100 includes a carrier 110, a first drive unit 120, a flow buffer unit 130 and an electron source 140. A sample is placed on the carrier 110. The first drive unit 120 drives a first fluid to flow along a first flow path P1, which passes through the sample. The flow buffer unit 130 is arranged in the first flow path P1, and performs buffering of the first fluid, which flows through the flow buffer unit 130 and carrier 110, in order. The electron source 140 provides an electron beam E to the sample.SELECTED DRAWING: Figure 1
申请公布号 JP2016115676(A) 申请公布日期 2016.06.23
申请号 JP20150240457 申请日期 2015.12.09
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 LEE HSIN-HUNG;LEE CHENG-YU;CHIANG CHUN-LIN;TSAI KUN-CHIH;LIN WIN-TI
分类号 H01J37/20;G01N1/28 主分类号 H01J37/20
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