发明名称 Preparation of sample for charged-particle microscopy
摘要 A method of preparing a sample for study in a charged-particle microscope, comprising the following steps: - Providing a substantially planar sample holder having opposed faces substantially parallel to one another, comprising at least one aperture that connects said faces and across which a membrane has been mounted, which membrane comprises at least one perforation; - Spanning a film of aqueous liquid across said perforation, which liquid comprises at least one study specimen suspended therein, particularly comprising the following steps: - Prior to said spanning step, placing a blotting sheet of blotting material in intimate contact with a first surface of said membrane, at a side distal from said sample holder; - Depositing said aqueous liquid through said aperture and onto a second surface of said membrane, opposite said first surface; - Subsequently removing said blotting sheet from said membrane.
申请公布号 EP3062082(A1) 申请公布日期 2016.08.31
申请号 EP20150156546 申请日期 2015.02.25
申请人 FEI COMPANY 发明人 RÉMIGY, HERVÉ-WILLIAM
分类号 G01N1/28;G01N1/42;H01J37/26 主分类号 G01N1/28
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