| 发明名称 |
MONITORING DOE PERFORMANCE USING SOFTWARE SCENE EVALUATION |
| 摘要 |
A method for projection includes projecting a pattern of structured light with a given average intensity onto a scene. A sequence of images is captured of the scene while projecting the pattern. At least one captured image in the sequence is processed in order to extract a depth map of the scene. A condition is identified in the depth map indicative of a fault in projection of the pattern. Responsively to the identified condition, the average intensity of the projection of the pattern is reduced. |
| 申请公布号 |
US2016371845(A1) |
申请公布日期 |
2016.12.22 |
| 申请号 |
US201514742816 |
申请日期 |
2015.06.18 |
| 申请人 |
APPLE INC. |
发明人 |
Yasovsky Alon;Deitch Ronen;Zmora Yohai |
| 分类号 |
G06T7/00;G06K9/46;G06K9/52;G02B27/42 |
主分类号 |
G06T7/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for projection, comprising:
projecting a pattern of structured light with a given average intensity onto a scene; capturing a sequence of images of the scene while projecting the pattern; processing at least one captured image in the sequence in order to extract a depth map of the scene, the depth map comprising an array of pixels with respective depth values; identifying in the depth map a condition indicative of a fault in projection of the pattern; and responsively to the identified condition, reducing the average intensity of the projection of the pattern. |
| 地址 |
Cupertino CA US |
