发明名称 Method of forming interconnections in semiconductor devices
摘要 A method for forming an conductive interconnection in an electronic semiconductor device includes forming a layer of insulating material on a substrate of semiconductor material having a contact region therein, and forming a first opening through the layer of insulating material to expose the contact region. The first opening is filled with a material to form a first connection element. A first layer comprising a first removable conductive material is formed adjacent the layer of insulating material and the first connection element. The method further includes forming a second opening in the first layer to expose the first connection element, and filling the second opening with the material to form a second connection element. The first removable conductive material is removed except for a portion underlying the second connection element to expose the layer of insulating material. The areas left free after removing the first removable conductive material are filled with a dielectric material.
申请公布号 US6475898(B2) 申请公布日期 2002.11.05
申请号 US20010014921 申请日期 2001.12.11
申请人 STMICROELECTRONICS S.R.L. 发明人 NAPOLITANO MARIO
分类号 H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/768
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