发明名称 CHIP TESTER
摘要 PURPOSE: A chip tester is provided to reduce a time for testing an object to be tested by minimizing errors which are occurred during a test process. CONSTITUTION: A user confirms the initial set-up and the test state of a chip tester, and the abnormality of a chip through a display unit(1). The kinds of chip to be used and the location of the chip are input to an input unit(3). Input signal and output signal is visually confirmed through a light emitting diode(4). A controller which functions as the main body of the chip tester is loaded on a substrate(2).
申请公布号 KR20100070537(A) 申请公布日期 2010.06.28
申请号 KR20080129124 申请日期 2008.12.18
申请人 KIM, BYEONG SEOK 发明人 KIM, BYEONG SEOK
分类号 G01R31/303 主分类号 G01R31/303
代理机构 代理人
主权项
地址