SEMICONDUCTOR DEVICE AND READING METHOD

摘要

PROBLEM TO BE SOLVED: To make it possible to reduce the number of times of retry read when data is read from a memory cell.SOLUTION: A semiconductor device in an embodiment reads data from a first address of a storage unit in accordance with each of a plurality of read conditions; selects, from the plurality of read conditions, the read condition corresponding to the smallest number of errors among a plurality of numbers of errors as a result of conducting error correction on the read data corresponding to the respective read conditions; and reads data from the first address multiple times in accordance with the selected read condition. Majority processing is performed among the respective data obtained by the multiple times of reading.SELECTED DRAWING: Figure 9