| 发明名称 | Circuitry to protect a test instrument | ||
| 摘要 | Controlling a test instrument may include: determining a first value corresponding to power output by the test instrument; determining a second value based on the first value, where the second value corresponds to an amount of energy consumed by the test instrument; and placing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold. | ||
| 申请公布号 | US9448274(B2) | 申请公布日期 | 2016.09.20 |
| 申请号 | US201414254363 | 申请日期 | 2014.04.16 |
| 申请人 | Teradyne, Inc. | 发明人 | Pounds Douglas W.;Carline Charles J. |
| 分类号 | G01N27/416;G01R31/28;G01R1/20 | 主分类号 | G01N27/416 |
| 代理机构 | Choate, Hall & Stewart LLP | 代理人 | Choate, Hall & Stewart LLP |
| 主权项 | 1. A method of controlling a test instrument; comprising: determining a first value corresponding to power output by the test instrument; determining a second value based on the first value, the second value corresponding to an amount of energy consumed by the test instrument; and placing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold; wherein the test instrument comprises multiple channels; and wherein the following are performed for a channel in the test instrument: determining the first value, determining the second value, and placing the test instrument in the high-impedance state. | ||
| 地址 | North Reading MA US | ||