发明名称 Semiconductor integrated circuit device with capacitor formed under bonding pad
摘要 A semiconductor device is provided which includes a semiconductor substrate having a main surface. A bonding pad is formed on the main surface. A multi-layer wiring structure is disposed between the main surface and the bonding pad. The multi-layer wiring structure includes a first wiring layer, a second wiring layer, and an interlayer insulating film therebetween. The first layer, the second layer, and the interlayer film form a capacitor disposed under the bonding pad.
申请公布号 US6476459(B2) 申请公布日期 2002.11.05
申请号 US19990352218 申请日期 1999.07.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE SANG-HEON
分类号 H01L23/52;H01L21/3205;H01L21/60;H01L21/822;H01L23/48;H01L23/485;H01L23/522;H01L27/04;H01L29/94;(IPC1-7):H01L29/00;H01L21/44 主分类号 H01L23/52
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