发明名称 Quantum well MOSFET channels having uni-axial strain caused by metal source/drains, and conformal regrowth source/drains
摘要 Embodiments described include straining transistor quantum well (QW) channel regions with metal source/drains, and conformal regrowth source/drains to impart a uni-axial strain in a MOS channel region. Removed portions of a channel layer may be filled with a junction material having a lattice spacing different than that of the channel material to causes a uni-axial strain in the channel, in addition to a bi-axial strain caused in the channel layer by a top barrier layer and a bottom buffer layer of the quantum well.
申请公布号 US7759142(B1) 申请公布日期 2010.07.20
申请号 US20080347268 申请日期 2008.12.31
申请人 INTEL CORPORATION 发明人 MAJHI PRASHANT;HUDAIT MANTU K.;KAVALIEROS JACK T.;PILLARISETTY RAVI;RADOSAVLJEVIC MARKO;DEWEY GILBERT;RAKSHIT TITASH;TSAI WILLMAN
分类号 H01L21/00 主分类号 H01L21/00
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