| 摘要 |
Provided is a test socket for an exchangeable electronic component. The provided test socket for an exchangeable electronic component includes: a body unit in which a seating hole is provided; a cover unit which is hingedly connected to the body unit; a connection unit which is inserted into and connected to the seating hole, may be exchanged according to the standard of a device to be tested and an arrangement form of connection terminals provided in the device to be tested, and has a connection pin formed therein to apply a test signal to the device to be tested; and a bonding unit which detachably connects the connection unit to the body unit. Accordingly, the present invention provides compatibility of the test socket, making it possible to efficiently use a product, and may improve convenience of use of the product. |
