发明名称 SYNCHRONIZING DRAM HAVING TEST MODE WHICH CAN PERFORM AUTOMATIC REFRESH OPERATION BY EXTERNAL ADDRESS, AND AUTOMATIC REFRESH METHOD
摘要 PROBLEM TO BE SOLVED: To perform automatic refresh operation for all memory cell arrays by responding to a mode register signal generated by receiving a signal externally applied responding to plural control signals, and outputting selectively an external address externally applied and an internal address to a memory cell address array. SOLUTION: An address selector 15 selects an internal address CNTi and outputs it, thereby, word lines of main cells of a memory cell array 11 are sequentially accessed, only main cells are sequentially and automatically refreshed. Further, at the time of automatic refresh operation of a test mode, as the address selector 15 selects an external address TAiB and outputs it, word lines of main cells and word lines of spare cells can be sequentially accessed by adjusting externally the external address TAiB. Therefore, both of main cells and spare cells of the memory cell array 11 can be sequentially refreshed.
申请公布号 JP2000357398(A) 申请公布日期 2000.12.26
申请号 JP20000132945 申请日期 2000.05.01
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 RI MANCHU;SAI MANSHOKU
分类号 G06F12/16;G06F12/00;G11C7/10;G11C11/401;G11C11/406;G11C29/00;G11C29/04;G11C29/08;G11C29/24 主分类号 G06F12/16
代理机构 代理人
主权项
地址