APPARATUS FOR TESTING SEMICONDUCTOR WAFER,申请号KR20000021225-传众专利搜索

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发明名称	APPARATUS FOR TESTING SEMICONDUCTOR WAFER
摘要
申请公布号	KR20010097278(A)	申请公布日期	2001.11.08
申请号	KR20000021225	申请日期	2000.04.21
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	KIM, NAM JUNG
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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