发明名称 Magnetic memory cells and manufacturing methods
摘要 An improved magnetoresistive memory device has a reduced distance between the magnetic memory element and a conductive memory line used for writing to the magnetic memory element. The reduced distance is facilitated by forming the improved magnetoresistive memory device according to a method that includes forming a mask over the magnetoresistive memory element and forming an insulating layer over the mask layer, then removing portions of the insulating layer using a planarization process. A conductive via can then be formed in the mask layer, for example using a damascene process. The conductive memory line can then be formed over the mask layer and conductive via.
申请公布号 US2007096230(A1) 申请公布日期 2007.05.03
申请号 US20060610760 申请日期 2006.12.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIU YUAN-HUNG;WU CHIH-TA;CHAO LAN-LIN;TU YEUR-LUEN;LIN WEN-CHIN;TSAI CHIA-SHIUNG
分类号 H01L43/00;H01L29/82 主分类号 H01L43/00
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