发明名称 Micromechanical inertial sensor and method for manufacturing same
摘要 A micromechanical inertial sensor includes an ASIC element having a processed front side, an MEMS element having a micromechanical sensor structure, and a cap wafer mounted above the micromechanical sensor structure, which sensor structure includes a seismic mass and extends over the entire thickness of the MEMS substrate. The MEMS element is mounted on the processed front side of the ASIC element above a standoff structure and is electrically connected to the ASIC element via through-contacts in the MEMS substrate and in adjacent supports of the standoff structure. A blind hole is formed in the MEMS substrate in the area of the seismic mass, which blind hole is filled with the same electrically conductive material as the through-contacts, the conductive material having a greater density than the MEMS substrate.
申请公布号 US9434606(B2) 申请公布日期 2016.09.06
申请号 US201313890752 申请日期 2013.05.09
申请人 ROBERT BOSCH GMBH 发明人 Classen Johannes;Hattass Mirko;Meisel Daniel Christoph
分类号 B81C1/00;B81B3/00;G01P15/00;G01P15/08 主分类号 B81C1/00
代理机构 Norton Rose Fulbright US LLP 代理人 Norton Rose Fulbright US LLP
主权项 1. A micromechanical inertial sensor, comprising: at least one ASIC element having a processed front side; at least one MEMS element having a micromechanical sensor structure which includes at least one seismic mass and extends over an entire thickness of a substrate of the MEMS element, wherein the MEMS element is mounted on the processed front side of the ASIC element above a standoff structure, and wherein the MEMS element is electrically connected to the ASIC element via through-contacts in the substrate of the MEMS element and in adjacent supports of the standoff structure; and a cap wafer mounted above the micromechanical sensor structure of the MEMS element; wherein, at least in an area of the seismic mass, at least one blind hole is formed in the substrate of the MEMS element, the blind hole being filled with an electrically conductive material which also fills the through-contacts, and wherein the electrically conductive material has a greater density than the substrate material of the MEMS element.
地址 Stuttgart DE