| 摘要 |
PURPOSE: A TAP IC contact type probe unit for the inspection of a LCD is provided to improve the efficiency of LCD property inspection. CONSTITUTION: An angle plate(200) is fixed and coupled in the bottom surface of a block body. A tension plate(300) is attached to the bottom surface of the angle plate and is projected in the front end of the angle plate. A block body support is attached to the bottom surface of the block body and the angle plate. A TAP IC(500) is attached to the bottom surface of the block body support and the bottom surface of the tension plate. |
