发明名称 METHOD FOR SELECTIVELY FORMING NITRIDE CAPS ON METAL GATES AND SELF-ALGINED CONTACT COMPRISING THE NITRIDE CAPS
摘要 A sacrificial cap is grown on an upper surface of a conductor. A dielectric spacer is against a side of the conductor. An upper dielectric side spacer is formed on a sidewall of the sacrificial cap. The sacrificial cap is selectively etched, leaving a cap recess, and the upper dielectric side spacer facing the cap recess. Silicon nitride is filled in the cap recess, to form a center cap and a protective cap having center cap and the upper dielectric spacer.
申请公布号 WO2016191407(A1) 申请公布日期 2016.12.01
申请号 WO2016US33876 申请日期 2016.05.24
申请人 QUALCOMM INCORPORATED 发明人 BAO, Junjing;YANG, Haining;LIU, Yanxiang;XU, Jeffrey Junhao
分类号 H01L21/768;H01L29/417;H01L29/66;H01L29/78 主分类号 H01L21/768
代理机构 代理人
主权项
地址