发明名称 POLISHING AGENT, POLISHING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a polishing agent capable of achieving high selectivity by suppressing a polishing speed against a silicon nitride film low while maintaining a sufficiently high polishing speed against a silicon oxide film, and a polishing method.SOLUTION: The polishing agent contains cerium oxide particles, water-soluble polyamine, potassium hydrate, organic acid and/or salt thereof, and water. The polishing agent has pH of higher than or equal to 10. The water-soluble polyamine is preferably water-soluble polyether polyamine having a weight average molecular weight of 100 to 2000. The organic acid is preferably gluconic acid or N-[Tris (hydroxymethyl) methyl] glycine.SELECTED DRAWING: Figure 1
申请公布号 JP2016154208(A) 申请公布日期 2016.08.25
申请号 JP20150211386 申请日期 2015.10.28
申请人 ASAHI GLASS CO LTD 发明人 SUZUKI MASARU;OTSUKI TOSHIHIKO
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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