发明名称 PATTERN FORMING METHOD, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, METHOD FOR PRODUCING ELECTRONIC DEVICE USING THESE, AND ELECTRONIC DEVICE
摘要 Provided is a pattern forming method comprising a step in which a film is formed using an actinic ray-sensitive or radiation-sensitive resin composition, a step in which the film is exposed, and a step in which the film is developed using a developer after exposure, and a positive pattern is formed. The actinic ray-sensitive or radiation-sensitive resin composition contains a resin (P1) comprising at least a repeating unit (a) represented by general formula (1) as a repeating unit having a group that produces a polar group as a result of being decomposed by the action of an acid.
申请公布号 WO2016136481(A1) 申请公布日期 2016.09.01
申请号 WO2016JP54019 申请日期 2016.02.10
申请人 FUJIFILM CORPORATION 发明人 TAKADA, Akira;HIRANO, Shuji;MOCHIZUKI, Hidehiro;TAKAHASHI, Toshiya;FUKUHARA, Toshiaki
分类号 G03F7/039;C08F12/14;C08F20/02;G03F7/20 主分类号 G03F7/039
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