发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having high reliability, and to provide a manufacturing method thereof. <P>SOLUTION: The method of manufacturing a semiconductor device, includes mounting a semiconductor chip 20 having an electrode 25 on a wiring substrate 10 having a base substrate 12 and a wiring 14 formed on the base substrate 12, allowing the wiring 14 to contact the electrode 25 and heating and pressurizing them to form an eutectic alloy 30. In this case, the eutectic alloy 30 is formed so that its one part enters in between the wiring 14 and the base substrate 12. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006344780(A) 申请公布日期 2006.12.21
申请号 JP20050169340 申请日期 2005.06.09
申请人 SEIKO EPSON CORP 发明人 URUSHIDO TATSUHIRO
分类号 H01L21/60 主分类号 H01L21/60
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