发明名称 |
Semiconductor device and method of manufacturing semiconductor device |
摘要 |
A semiconductor device includes a substrate having an active region, a first gate structure over a top surface of the substrate, a second gate structure over the top surface of the substrate, a pair of first spacers on each sidewall of the first gate structure, a pair of second spacers on each sidewall of the second gate structure, an insulating layer over at least the first gate structure, a first conductive feature over the active region and a second conductive feature over the substrate. Further, the second gate structure is adjacent to the first gate structure and a top surface of the first conductive feature is coplanar with a top surface of the second conductive feature. |
申请公布号 |
US9412700(B2) |
申请公布日期 |
2016.08.09 |
申请号 |
US201414515276 |
申请日期 |
2014.10.15 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Hsieh Tung-Heng;Zhuang Hui-Zhong;Lin Chung-Te;Chiang Ting-Wei;Wang Sheng-Hsiung;Tien Li-Chun |
分类号 |
H01L27/088;H01L23/535;H01L29/40;H01L21/768 |
主分类号 |
H01L27/088 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. An integrated circuit comprising:
a substrate comprising:
a source feature, anda drain feature; a first gate structure over a top surface of the substrate, wherein the first gate structure is between the source feature and the drain feature; a second gate structure over the top surface of the substrate, wherein the second gate structure is adjacent to the first gate structure and the source feature; a pair of first spacers on each sidewall of the first gate structure; a pair of second spacers on each sidewall of the second gate structure; an insulating layer over at least the first gate structure, the insulating layer being embedded between the pair of first spacers on each sidewall of the first gate structure; a first conductive feature over the source feature or the drain feature, wherein a top surface of the first conductive feature is coplanar with a top surface of the insulating layer; a second conductive feature over the substrate; and a third conductive feature, wherein the third conductive feature is over the first conductive feature or the second conductive feature. |
地址 |
Hsin-Chu TW |