发明名称 |
Nano wire structure and method for fabricating the same |
摘要 |
A device comprises a first group of nanowires having a first pattern, a second group of nanowires having a second pattern, a third group of nanowires having a third pattern and a fourth group of nanowires having a fourth pattern, wherein the first pattern, the second pattern, the third pattern and the fourth pattern form a repeating pattern. |
申请公布号 |
US9412614(B2) |
申请公布日期 |
2016.08.09 |
申请号 |
US201414290673 |
申请日期 |
2014.05.29 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Fu Ching-Feng;Chen De-Fang;Yen Yu-Chan;Lee Chia-Ying;Lee Chun-Hung;Lin Huan-Just |
分类号 |
H01L21/00;H01L21/308;H01L29/78;H01L29/06;H01L29/10;H01L21/8234;H01L27/088 |
主分类号 |
H01L21/00 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A method comprising:
applying a first patterning process to a first photoresist layer, wherein the first photoresist layer is formed over a sacrificial layer, and wherein the sacrificial layer is formed over a substrate; forming first openings in the sacrificial layer through a first etching process; applying a second patterning process to a second photoresist layer, wherein the second photoresist layer is formed over the sacrificial layer; forming second openings in the sacrificial layer through a second etching process, wherein the second openings and the first openings are arranged in an alternating manner; and forming first nanowires based on the first openings and second nanowires based on the second openings. |
地址 |
Hsin-Chu TW |