发明名称 Nano wire structure and method for fabricating the same
摘要 A device comprises a first group of nanowires having a first pattern, a second group of nanowires having a second pattern, a third group of nanowires having a third pattern and a fourth group of nanowires having a fourth pattern, wherein the first pattern, the second pattern, the third pattern and the fourth pattern form a repeating pattern.
申请公布号 US9412614(B2) 申请公布日期 2016.08.09
申请号 US201414290673 申请日期 2014.05.29
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Fu Ching-Feng;Chen De-Fang;Yen Yu-Chan;Lee Chia-Ying;Lee Chun-Hung;Lin Huan-Just
分类号 H01L21/00;H01L21/308;H01L29/78;H01L29/06;H01L29/10;H01L21/8234;H01L27/088 主分类号 H01L21/00
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A method comprising: applying a first patterning process to a first photoresist layer, wherein the first photoresist layer is formed over a sacrificial layer, and wherein the sacrificial layer is formed over a substrate; forming first openings in the sacrificial layer through a first etching process; applying a second patterning process to a second photoresist layer, wherein the second photoresist layer is formed over the sacrificial layer; forming second openings in the sacrificial layer through a second etching process, wherein the second openings and the first openings are arranged in an alternating manner; and forming first nanowires based on the first openings and second nanowires based on the second openings.
地址 Hsin-Chu TW