发明名称 PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a processing method, wherein the surface of an object which is to be processed is supplied uniformly with a processing liquid for preventing the contamination of the object. SOLUTION: With a semiconductor wafer W supplied with a processing liquid from a processing liquid supply nozzle 21, the semiconductor wafer W is rotated by a spin chuck 20, while the processing liquid supply nozzle 21 is moved linearly in the horizontal direction or made to move swinging. Thus, the processing liquid is supplied uniformly from a central part to an outer peripheral part of the semiconductor wafer W, for improved uniform process.
申请公布号 JPH11317358(A) 申请公布日期 1999.11.16
申请号 JP19990045968 申请日期 1999.02.24
申请人 TOKYO ELECTRON LTD 发明人 KIMURA YOSHIO
分类号 B05D1/40;B05C5/00;B05C11/08;G03F7/16;G03F7/30;H01L21/027;(IPC1-7):H01L21/027 主分类号 B05D1/40
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