| 摘要 |
PROBLEM TO BE SOLVED: To provide an x-ray diffraction measurement sample preparation method capable of carrying out more accurate measurement by reducing a variation in diffraction angle (2θ) and half width caused by filling unevenness of a powder sample in powder XRD measurement.SOLUTION: The preparation method of a measurement sample used for powder XRD measurement, includes the steps in order of: (1) preparing a sample preparation pedestal having a thickness adjusting tool; (2) preparing a resin surface plate making a pair with the sample preparation pedestal; (3) placing a measured powder sample and a liquid curable resin on the resin surface of the sample preparation pedestal; (4) forming a mixture of both; (5) pressing and curing the mixture to create a measurement sample test piece having a parallel surface; (6) taking out the created measurement sample test piece; (7) shaping the measurement sample test piece to create a measurement sample; (8) placing an adhesive material in the recess bottom of a measurement holder having a recess; and (9) adjusting and fixing the measurement sample placed on the adhesive material so as not to form any step between the upper surface thereof and a measurement holder upper surface.SELECTED DRAWING: Figure 1 |
