发明名称 Polarization-influencing optical arrangement, in particular in a microlithographic projection exposure apparatus
摘要 The disclosure provides a polarization-influencing optical arrangement that includes a first retardation element and a second retardation element. The optical arrangement is configurable so that a polarization-influencing effect of the first retardation element corresponds to an effect of a first lambda/2 plate having a first fast axis of the birefringence and a polarization-influencing effect of the second retardation element corresponds to an effect of a second lambda/2 plate having a second fast axis of the birefringence. An angle between the first fast axis and the second fast axis is 45°±5°.
申请公布号 US9411245(B2) 申请公布日期 2016.08.09
申请号 US201314297273 申请日期 2013.01.11
申请人 Carl Zeiss SMT GmbH 发明人 Saenger Ingo;Schlesener Frank
分类号 G03B27/72;G03B27/54;G03F7/20;G02B27/28;G02B5/30 主分类号 G03B27/72
代理机构 Fish & Richardson P.C. 代理人 Fish & Richardson P.C.
主权项 1. An optical arrangement, comprising: a first retardation element comprising a first partial element comprising an optically positively uniaxial crystal material, and a second partial element comprising an optically negatively uniaxial crystal material; and a second retardation element comprising a third partial element comprising an optically positively uniaxial crystal material, and a fourth partial element comprising an optically negatively uniaxial crystal material, wherein: the optical arrangement is configurable so that a polarization-influencing effect of the first retardation element corresponds to an effect of a first lambda/2 plate having a first fast axis of the birefringence and a polarization-influencing effect of the second retardation element corresponds to an effect of a second lambda/2 plate having a second fast axis of the birefringence;an angle between the first fast axis and the second fast axis is 45°±5°; andthe optical arrangement is a microlithographic optical arrangement.
地址 Oberkochen DE