发明名称 |
SAMPLING CLOCK GENERATING CIRCUIT WHICH GUARANTEES INPUT SET-UP/HOLD TIME MARGIN, METHOD THEREOF, SYNCHRONIZED SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM WHICH INCLUDES THE SAME SAMPLING CLOCK GENERATING CIRCUIT |
摘要 |
A sampling clock generating circuit capable of guaranteeing input set-up/hold time margin, a method thereof, a synchronous semiconductor memory device and a memory system are provided to operate the memory system smoothly in a high speed operation by guaranteeing the input set-up/hold time margin of a command and an address inputted to the semiconductor memory device. A clock input buffer(110) generates a first internal clock signal by buffering an external clock signal applied from the outside. A level sensing pulse generation part(120) receives the first internal clock signal, and generates unit sensing pulses with a fixed duration in response to each rising edge of the first internal clock signal. A logic level latch part(130) receives the unit sensing pulses and a chip selection signal, and latches the logic level of the inputted chip selection signal by using the unit sensing pulses, and outputs the latched logic level as a signal. A sampling clock generation part(140) receives the logic level signal, an MRS_NT control signal and the first internal clock signal, and generates a second internal clock signal by masking the first internal clock signal at every N period according to the MRS_NT control signal, when the logic level signal becomes a logic low state.
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申请公布号 |
KR20070117248(A) |
申请公布日期 |
2007.12.12 |
申请号 |
KR20060051236 |
申请日期 |
2006.06.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HYUN SOO;LIM, JONG HYOUNG |
分类号 |
G11C11/4076 |
主分类号 |
G11C11/4076 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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