发明名称 METHOD FOR ESTIMATION OF RESPONSE-STRENGTH AND RESPONSE-TIME IN EVENT-RELATED EEG-BAND PATTERN
摘要 A method for estimating response-strength and a response-time in an event-related EEG(ElectroEncephaloGram)-band pattern is provided to determine response capability by executing overall evaluation of the response capability in consideration of the response-strength, the response-time, and a response activation time. A method for estimating response-strength and a response-time in an event-related EEG-band pattern includes the steps of: adjusting a position of a base line by primarily differentiating the pattern; and estimating any one of H1, H2, and H3 as the response-strength, estimating a T1 as the response-time, and estimating a D1 as a response activation time. The H1 is a positive top or a negative top of a peak at which first response speed(7) is generated with respect to the base line. The H2 is a positive top or a negative top of a peak at which a second response speed(8) is generated. The H3 is the sum of the H1 and the H2. The T1 is a time from generation of the response speed to the H1, and the D1 is a distance from the H1 to the base line before the H2.
申请公布号 KR20080085951(A) 申请公布日期 2008.09.25
申请号 KR20070027408 申请日期 2007.03.21
申请人 LAXTHA 发明人 CHOI, JUNG MI
分类号 A61B5/048;A61B5/0476 主分类号 A61B5/048
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