发明名称 METHOD OF TREATING WAFER
摘要 <p><P>PROBLEM TO BE SOLVED: To reduce quantity of dumped semiconductors when manufacturing a semiconductor device comprising an expensive semiconductor, such as silicon. <P>SOLUTION: A wafer W in which a device D is formed on a front W1 is irradiated with transmitting laser beams 31a from the side of a rear W2; the laser beams 31a are condensed to prescribed depth to form an altered layer L between the side of the front W1 of the wafer W and the side of the rear W2; separation is made into a rear-side wafer at a rear side of the altered layer L and a front-side wafer at a front side of the altered layer L; and the altered layer remaining in the front-side wafer is removed to finish the front-side wafer to a prescribed thickness, thus commercially introducing a device for composing the front-side wafer, and recycling the rear-side wafer. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010021398(A) 申请公布日期 2010.01.28
申请号 JP20080181167 申请日期 2008.07.11
申请人 DISCO ABRASIVE SYST LTD 发明人 SEKIYA KAZUMA
分类号 H01L21/301;B23K26/38;B23K26/40;H01L21/304 主分类号 H01L21/301
代理机构 代理人
主权项
地址