Testing of a transient voltage protection device

摘要

A method of testing a voltage protection device in a circuit is provided. The circuit comprises a source and load and a detector is provided in parallel with the protection device. The method comprises opening a switching device provided in the circuit. The method further comprises detecting a property of a voltage spike caused by the rate of change of current in the circuit inductance produced by the opening of the switching device to determine the condition of the protection device.

主权项

1. A protection device tester for testing a protection device in a circuit comprising a source and load, the protection device tester comprising:
a detector electrically connected in parallel to the protection device to detect a property of a voltage spike produced by opening a switching device provided in the circuit; and a controller provided within the detector to determine a condition of the protection device based on the detected property of the voltage spike produced by the opening of the switching device, wherein the switching device comprises a plurality of switches, wherein the switches are semiconductor devices electrically connected in parallel to be opened or closed individually.