发明名称 FABRICATION OF A TRANSISTOR INCLUDING A TUNNELING LAYER
摘要 In a particular embodiment, an apparatus includes an electron tunnel structure. The electron tunnel structure includes a tunneling layer, a channel layer, a source layer, and a drain layer. The tunneling layer and the channel layer are positioned between the source layer and the drain layer. The transistor device further includes a high-k dielectric layer adjacent to the electron tunnel structure.
申请公布号 WO2016118376(A3) 申请公布日期 2016.09.29
申请号 WO2016US13180 申请日期 2016.01.13
申请人 QUALCOMM INCORPORATED 发明人 YUAN, Jun;LI, Xia;YANG, Bin
分类号 H01L29/51;H01L21/28;H01L29/161;H01L29/49;H01L29/66;H01L29/739;H01L29/78 主分类号 H01L29/51
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