发明名称 |
Monolithic integration of GaN and InP components |
摘要 |
A compound semiconductor integrated circuit comprising a first substrate; a first electronic component formed on top of said first substrate; a layer of a first dielectric material formed on top of said first substrate and including said first electronic component, said layer of a first dielectric material comprising a recess exposing a first region of said first substrate; and a layer of a second dielectric material attached to said first substrate on top of said first region of said first substrate after manufacturing of said layer of a second dielectric material, said layer of a second material comprising a second electronic component. |
申请公布号 |
US9515068(B1) |
申请公布日期 |
2016.12.06 |
申请号 |
US201314014121 |
申请日期 |
2013.08.29 |
申请人 |
HRL Laboratories, LLC |
发明人 |
Patterson Pamela R.;Shinohara Keisuke;Sharifi Hasan;Ha Wonill;Hussain Tahir;Li James Chingwei;Wheeler Dana C. |
分类号 |
H01L27/00;H01L27/06;H01L21/84;H01L27/12;H01L23/48 |
主分类号 |
H01L27/00 |
代理机构 |
Ladas & Parry |
代理人 |
Ladas & Parry |
主权项 |
1. A compound semiconductor integrated circuit comprising:
a first substrate; a first electronic component formed on top of said first substrate; a layer of a first dielectric material formed on top of said first substrate and including said first electronic component, said layer of a first dielectric material comprising a recess exposing a first region of said first substrate; at least one first metallic contact being formed in said recess on top of and in contact with at least a portion of said first region; and a layer of a second dielectric material attached to said first substrate on top of said first region of said first substrate after manufacturing of said layer of a second dielectric material, a second electronic component being at least partly included in said layer of a second dielectric material and at least a portion of said second dielectric material being arranged within said recess; at least one second metallic contact being formed below at least a portion of said layer of a second material; said first and second metallic contacts being formed separately and then connected together. |
地址 |
Malibu CA US |