发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 There is provided a semiconductor device manufacturing method, including: a film forming process in which, by supplying a solution for modifying a surface layer of a resist to a target object having a resist pattern and allowing the solution to infiltrate into the resist, a film having elasticity and having no compatibility with the resist is formed in the surface layer of the resist; and a heating process in which the target object having the film formed thereon is heated.
申请公布号 US2016358769(A1) 申请公布日期 2016.12.08
申请号 US201615237840 申请日期 2016.08.16
申请人 TOKYO ELECTRON LIMITED 发明人 YAEGASHI Hidetami;OYAMA Kenichi;YAMATO Masatoshi;ISEKI Tomohiro;TSURUDA Toyohisa
分类号 H01L21/027;G03F7/36;G03F7/004;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址 Tokyo JP