发明名称 Shortened slit lamp microscope
摘要 An eye examination device including eye examination optics for examining a patient's eyes. A chin rest assembly accepts the patient's head and maintains the patient's head in a fixed stable position. The chin rest assembly can comprise two spaced apart upright posts for securing to a table, with a forehead rest member being secured to the two upright posts at an upper end, and a chin rest member being secured to the two upright posts below the forehead rest member. The chin rest member can have a chin rest portion which extends forwardly relative to an upright plane extending between centers of the two upright posts and away from the eye examination optics, so that generally only a front of the patient's face coincides with the upright plane when the patient's head engages the chin rest portion.
申请公布号 US2016374549(A1) 申请公布日期 2016.12.29
申请号 US201514757712 申请日期 2015.12.23
申请人 Xue Haixin;Hai Jacqueline 发明人 Xue Haixin;Hai Jacqueline
分类号 A61B3/00;A61B3/135 主分类号 A61B3/00
代理机构 代理人
主权项 1. An eye examination device comprising: eye examination optics for examining a patients eyes; and a chin rest assembly for accepting the patient's head and maintaining the patient's head in a fixed stable position, the chin rest assembly comprising two spaced apart upright posts for securing to a table, with a forehead rest member being secured to the two upright posts at an upper region and a chin rest member being secured to the two upright posts below the forehead rest member, the chin rest member having a chin rest portion which extends forwardly relative to an upright plane extending between centers of the two upright posts and away from the eye examination optics, so that generally at most, only a front of the patient's face coincides with the upright plane when the patient's head engages the chin rest portion.
地址 Lexington MA US