发明名称 METHOD OF REMOVAL PROFILE MODULATION IN CMP PADS
摘要 A polishing pad includes a plurality of polishing surfaces, a first group of the polishing surfaces made of a first material having a first coefficient of friction and a second group of the polishing surfaces made of a second material having a second coefficient of friction. The first and second groups of polishing surfaces may be arranged over the polishing pad so as to provide a non-planar material removal profile. The polishing surface layout may be designed by evaluating a material removal profile for an existing polishing pad of known characteristics, observing how variations in polishing surface densities and/or coefficients of friction affect that material removal profile, and then mapping the polishing surface coefficients of friction and density profiles to the subject polishing pad layout.
申请公布号 US2009011679(A1) 申请公布日期 2009.01.08
申请号 US20080141876 申请日期 2008.06.18
申请人 BAJAJ RAJEEV;NOLET ALAN 发明人 BAJAJ RAJEEV;NOLET ALAN
分类号 B24D11/00;B24B1/00 主分类号 B24D11/00
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