发明名称 EDDY CURRENT EXAMINATION METHOD AND USE OF APPARATUS
摘要 <p>It is an object of the present invention to provide an eddy current testing apparatus capable of accurately detecting any flaws occurring in a columnar or cylindrical subject to be tested regardless of their extending directions, with the use of the same probe coil. The eddy current testing apparatus 100 according to the present invention comprises a spinning plate 1 and a probe coil 2 disposed on the spinning plate 1. The probe coil is a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested. The spinning plate is disposed in such a position that a spinning center RC of the spinning plate faces with an axial center PC of the subject to be tested. A distance R between the spinning center of the spinning plate and a center of the probe coil is set so that a difference between a maximum amplitude of a differential output at an axially extending artificial flaw provided in the subject to be tested and a maximum amplitude of a differential output at a circumferentially extending artificial flaw provided in the subject to be tested falls within a predetermined range.</p>
申请公布号 EP2131190(A1) 申请公布日期 2009.12.09
申请号 EP20080722250 申请日期 2008.03.17
申请人 SUMITOMO METAL INDUSTRIES, LTD. 发明人 HYODO, SHIGETOSHI;NAKAO, YOSHIYUKI
分类号 G01N27/90 主分类号 G01N27/90
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