发明名称 |
HIGH-FREQUENCY COMPLEX PERMITTIVITY MEASURING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a high-frequency complex permittivity measuring apparatus capable of measuring even high power.SOLUTION: A complex permittivity measuring apparatus that measures complex permittivity by measuring complex voltage of a sample intervening between two parallel-flat-plate-like high-frequency transmission paths comprises: a first high-frequency transmission path that is connected to a high-frequency power generator; and a second high-frequency transmission path that is arranged in a form of parallel flat plate to the first high-frequency transmission path. The first high-frequency transmission path comprises: a load-resistor of which a terminal is grounded in conformity to the high-frequency transmission path; a first electrode that is connected to a complex voltage measuring instrument from the terminal through at least one attenuating resistor; and a second electrode that is connected to the complex voltage measuring instrument from a base end of the high-frequency transmission path through at least one attenuating resistor. The second high-frequency transmission path includes third and fourth electrodes that are arranged at two places having appropriate intervals in a longitudinal direction of the transmission path and are respectively connected to the complex voltage measuring instrument through at least one attenuating resistor.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016109486(A) |
申请公布日期 |
2016.06.20 |
申请号 |
JP20140245090 |
申请日期 |
2014.12.03 |
申请人 |
TOYOHASHI UNIV OF TECHNOLOGY |
发明人 |
TAMURA MASAYA;OHIRA TAKASHI;SAKAI NAOTAKA;KAMIYAMA YUSUKE |
分类号 |
G01N22/00;G01N27/22;G01R27/26 |
主分类号 |
G01N22/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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