发明名称 HIGH-FREQUENCY COMPLEX PERMITTIVITY MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a high-frequency complex permittivity measuring apparatus capable of measuring even high power.SOLUTION: A complex permittivity measuring apparatus that measures complex permittivity by measuring complex voltage of a sample intervening between two parallel-flat-plate-like high-frequency transmission paths comprises: a first high-frequency transmission path that is connected to a high-frequency power generator; and a second high-frequency transmission path that is arranged in a form of parallel flat plate to the first high-frequency transmission path. The first high-frequency transmission path comprises: a load-resistor of which a terminal is grounded in conformity to the high-frequency transmission path; a first electrode that is connected to a complex voltage measuring instrument from the terminal through at least one attenuating resistor; and a second electrode that is connected to the complex voltage measuring instrument from a base end of the high-frequency transmission path through at least one attenuating resistor. The second high-frequency transmission path includes third and fourth electrodes that are arranged at two places having appropriate intervals in a longitudinal direction of the transmission path and are respectively connected to the complex voltage measuring instrument through at least one attenuating resistor.SELECTED DRAWING: Figure 1
申请公布号 JP2016109486(A) 申请公布日期 2016.06.20
申请号 JP20140245090 申请日期 2014.12.03
申请人 TOYOHASHI UNIV OF TECHNOLOGY 发明人 TAMURA MASAYA;OHIRA TAKASHI;SAKAI NAOTAKA;KAMIYAMA YUSUKE
分类号 G01N22/00;G01N27/22;G01R27/26 主分类号 G01N22/00
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