发明名称 Semiconductor devices
摘要 Some embodiments include a semiconductor device having two gate electrodes which are of about a same gate width as one another, and having a first diffusion region between the two gate electrodes. The semiconductor device also has second and third diffusion regions on opposing sides of the two gate electrodes from one another and which sandwich the two gate electrodes and the first source/drain region therebetween. Each of the second and third diffusion regions is longer than the first diffusion region in a direction of the gate width. Some embodiments include a semiconductor device having a PMOS construction and an NMOS construction, with both constructions having a shorter middle diffusion region sandwiched between a pair of longer outer diffusion regions.
申请公布号 US9461045(B1) 申请公布日期 2016.10.04
申请号 US201514750139 申请日期 2015.06.25
申请人 Micron Technology, Inc. 发明人 Asano Shintaro;Sakito Yusuke
分类号 H01L27/02;H01L27/092;H01L29/78;H01L23/535;H01L29/06 主分类号 H01L27/02
代理机构 Wells St. John P.S. 代理人 Wells St. John P.S.
主权项 1. A semiconductor device comprising: two gate electrodes, the gate electrodes being of about a same gate width as one another; a first diffusion region between the two gate electrodes, and being a first source/drain region; second and third diffusion regions on opposing sides of the two gate electrodes from one another and which sandwich the two gate electrodes and the first source/drain region therebetween; the second and third diffusion regions being second and third source/drain regions, respectively; the first source/drain region being a first kind of region corresponding to either a source region or a drain region; the second and third source/drain regions being a second kind of region different from the first kind and either both being source regions or both being drain regions; each of the second and third diffusion regions being longer than the first diffusion region in a direction of the gate width; wherein multiple contacts extend to each of the first, second and third diffusion regions; wherein there are more contacts extending to the second and third diffusion regions than to the first diffusion region; and wherein said direction of the gate width is a length direction of the first, second and third diffusion regions; wherein each of the first, second and third diffusion regions has opposing edges on each side of its length, with the device having a first side defined by one set of edges of the first, second and third diffusion regions, and having a second side defined by another set of edges of the first, second and third diffusion regions; and wherein both of the first and second sides have edges of the first diffusion region inset relative to edges of the second and third diffusion regions.
地址 Boise ID US