X-RAY DIFFRACTOMETER,申请号JP19940206134-传众专利搜索

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发明名称	X-RAY DIFFRACTOMETER
摘要
申请公布号	JPH0854360(A)	申请公布日期	1996.02.27
申请号	JP19940206134	申请日期	1994.08.09
申请人	NEC CORP	发明人	TANIGAWA AKIO;AKIMOTO KOICHI
分类号	G01N23/207;(IPC1-7):G01N23/207	主分类号	G01N23/207
代理机构		代理人
主权项
地址

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