| 摘要 |
A method for correcting defects in X-ray images includes identifying potentially defective picture elements (p) in X-ray images (I), created during normal operation, by comparing a value (W(p)) of the picture elements with corresponding values in a neighborhood (n(p)). If a picture element (p) has been classified as “potentially defective” in more than a specified percentage of X-ray images, it is entered in a defect map which is refreshed on a continuous basis. The defect map can then be used to correct other X-ray images.
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