发明名称 SPLIT GATE TYPE NONVOLATILE MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 In a split gate type nonvolatile memory device and a method of fabricating the same. A supplementary layer pattern is disposed on a source region of a semiconductor substrate. Since the source region is vertically extended by virtue of the presence of the supplementary layer pattern, it is therefore possible to increase an area of a region where a floating gate overlaps the source region and the supplementary layer pattern. Accordingly, the capacitance of a capacitor formed between the source and the floating gate increases so that it is possible for the nonvolatile memory device to perform program/erase operations at a low voltage level.
申请公布号 US2008318406(A1) 申请公布日期 2008.12.25
申请号 US20080194202 申请日期 2008.08.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JEON HEE-SEOG;YOON SEUNG-BEOM;HAN JEONG-UK;KIM YONG-TAE
分类号 H01L21/3205 主分类号 H01L21/3205
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