发明名称 半導体装置レシピ管理方法
摘要 Systems and methods for managing optical inspection target components are disclosed. A method may include, but is not limited to: storing at least one external recipe component at an inspection tool node; associating at least one proxy component with the at least one external recipe component; associating the at least one external recipe component with at least one optical inspection target recipe; and storing the at least one optical inspection target recipe including the at least one proxy component in a recipe distribution server. A method may include, but is not limited to: receiving a selection of at least one recipe associated with an optical inspection target to be inspected at a first inspection tool node; and determining whether one or more external recipe components associated with the recipe are stored on at least one of the first inspection tool node and a second node.
申请公布号 JP5921541(B2) 申请公布日期 2016.05.24
申请号 JP20130519684 申请日期 2011.05.24
申请人 ケーエルエー−テンカー コーポレイション 发明人 デビッド ドミニク ジェラルド;リー クリス ダブリュ
分类号 H01L21/66 主分类号 H01L21/66
代理机构 代理人
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