发明名称 SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE
摘要 A multi-gate structure is used and a width (d1) of a high concentration impurity region sandwiched by two channel forming regions in a channel length direction is set to be shorter than a width (d2) of low concentration impurity regions in the channel length direction. Thus, a resistance of the entire semiconductor layer of a TFT which is in an on state is reduced to increase an on current. In addition, a carrier life time due to photoexcitation produced in the high concentration impurity region can be shortened to reduce light sensitivity.
申请公布号 US2016211278(A1) 申请公布日期 2016.07.21
申请号 US201615074332 申请日期 2016.03.18
申请人 Semicondudor Energy Laboratory Co., LTD. 发明人 SHIBATA Hiroshi;MAEKAWA Shinji
分类号 H01L27/12 主分类号 H01L27/12
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP