| 摘要 |
The invention relates to a method for the SPIM analysis of a sample (6) and to a device for the SPIM analysis of a sample (6), said device having an illumination device for generating a sheet of light and a detection arrangement comprising a detection lens system and a detection beam path. The invention is characterised in that multiple sample layers (8, 9, 10) can be simultaneously illuminated with a single sheet of light (4) and in that the detection light (11) emanating from the individual sample layers (8, 9, 10) is detected at different times and/or at different positions. |
