发明名称 Programmable contact structure and its forming method.
摘要 <p>A programmable semiconductor contact structure and method are provided. A semiconductor substrate has a first patterned conductive layer for forming an interconnect. A first insulating layer overlies the first patterned conductive layer. An opening is formed through the insulating layer to the first patterned conductive layer to form the contact via. A buffer layer overlies portions of the first insulating layer and covers the opening. A third conductive layer overlies the buffer layer. A fourth conductive layer then overlies the integrated circuit. The buffer layer is a material, such as amorphous silicon, which functions as an anti-fuse and can be programmed by application of a relatively high programming voltage. <IMAGE></p>
申请公布号 EP0583119(A1) 申请公布日期 1994.02.16
申请号 EP19930306053 申请日期 1993.07.30
申请人 SGS-THOMSON MICROELECTRONICS, INC. 发明人 WEI, CHE-CHIA
分类号 H01L21/28;H01L21/82;H01L23/525;H01L29/41;(IPC1-7):H01L23/525 主分类号 H01L21/28
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