发明名称 Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device
摘要 A test apparatus for testing digitized test responses has a generator ( 2 ) and a signal extractor ( 3 ). The generator ( 2 ) uses direct digital synthesis to generate a set of n digital reference signals (x<SUB>k</SUB>, y<SUB>k</SUB>) which are orthogonal to one another. In this case, n is a natural number greater than 1. The signal extractor ( 3 ) contains a test input and a plurality of reference inputs. The test input receives a digitized test response (E) and the reference inputs are connected to the reference signals (x<SUB>k</SUB>, y<SUB>k</SUB>) which are generated by the generator ( 2 ). The signal extractor ( 3 ) generates scalar products from a respective reference signal (x<SUB>k</SUB>, y<SUB>k</SUB>) and the test response (E) and uses said products to calculate whether a combination of reference signals (x<SUB>k</SUB>, y<SUB>k</SUB>) is contained in the test response (E).
申请公布号 US2007089010(A1) 申请公布日期 2007.04.19
申请号 US20060534005 申请日期 2006.09.21
申请人 KIRMSER STEPHANE;MATTES HEINZ;SATTLER SEBASTIAN 发明人 KIRMSER STEPHANE;MATTES HEINZ;SATTLER SEBASTIAN
分类号 G01R31/28;G06F11/00 主分类号 G01R31/28
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