| 摘要 |
An integrated circuit, in particular a microcontroller, for operation in an area with ionizing radiation, has at least one part of a temperature control circuit. The temperature control circuit performs a regulated increase in the circuit temperature to a predefined, essentially constant operating temperature, by increasing the electrical power consumption of the circuit by an adjustable additional electrical power. The circuit has an output facility for information about damage to the integrated circuit caused by the ionizing radiation impacting thereon, it being possible to determine the information about damage from a radiation-dose-dependent decrease in the adjustable additional electrical power. |
