发明名称 |
THIN FILM TRANSISTOR MANUFACTURING METHOD AND THIN FILM TRANSISTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a thin film transistor manufacturing method and a thin film transistor, which can suppress deterioration and variation in performance.SOLUTION: A manufacturing method of a thin film transistor 1(1B) of the present embodiment includes the steps of: forming an oxide semiconductor layer 3 on one principal surface of a substrate 2; forming a first conductive layer on the oxide semiconductor layer 3 and forming a second conductive layer on the other principal surface of the substrate 2; collectively forming a mask layer on the first conductive layer and second conductive layer; and collectively contacting the first conductive layer and second conductive layer with an etchant to remove a partial region of the first conductive layer and second conductive layer to form a source electrode 6 and a drain electrode 7 on the oxide semiconductor layer 3, and forming a gate electrode 5 on the other principal surface of the substrate 2.SELECTED DRAWING: Figure 9 |
申请公布号 |
JP2016192437(A) |
申请公布日期 |
2016.11.10 |
申请号 |
JP20150070347 |
申请日期 |
2015.03.30 |
申请人 |
NISSHA PRINTING CO LTD |
发明人 |
NADA HIDEAKI;OMOTE RYOMEI;SHIGENO HIROTAKA;SAKATA YOSHIHIRO;OKUMURA SHUZO |
分类号 |
H01L21/336;H01L21/28;H01L29/417;H01L29/423;H01L29/49;H01L29/786 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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